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Shack-Hartmann wavefront sensors and software
High Wavefront Dynamic Range and Accuracy
Wavefront dynamic range up to 1500 Λ
Λ / 100 RMS accuracy (400-1100 nm) |
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Laser Beam Analysis
Peak-to-Valley, RMS wavefront error, Zernike aberrations, M2,
2D & 3D phase displays, 2D & line profile intensity displays, beam diameter, waist location and size, beam divergence, PSF, Strehl ratio, 2D & 3D MTF, export data to CSV files and images to PNG files, test reports with data and images Software development kit available: C++, LabVIEW |
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Laser Beam Propagation
Laser beam propagation display shows beam characteristics:,
detailed beam parameters and intensity shape
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Other Shack-Hartmann-based products include:
Lens Diagnostics
Automated hardware and software system for characterizing optics from 1.5 mm to 12 mm diameter with any numerical aperture
Total precision wavefront characterization of miniature optics and objectives that
allows you to measure aberrations, back focal length (BFL), effective focal length (EFL), chromatism,
field curvature, distortion, vignetting, and relative illumination as a function of the field calculate
the 3D MTF and the MTF through-focus for all measured points in the field as well as to determine the
best focal plane.
3-dimensional MTF measurement on all of the azimuths simultaneously
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Surface measurement
Unites wavefront sensor with an auto-collimator and a changeable focusing module
to provide users with a versatile and turnkey solution for precision characterization of optical systems and
surfaces
Can be adapted to each user's requirements by choosing the focusing module best suited
for the task
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Wavelength ranges of Shack-Hartmann models are:
Extreme UV
7-to-25 nm
UV
193-to-300 nm
Visible
400-to-1100 nm
NIR
1.5-to-1.6 µm
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To contact HMS Technology Sales for Shack-Hartmann data sheets, technical papers and pricing
click here
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